SAE AS 6171/11:2016 PDF Download

The SAE AS 6171/11:2016 standard provides guidelines for the application of design recovery methods in identifying suspect or counterfeit electronic parts. It covers various aspects such as operator training, sample preparation, imaging techniques, data interpretation, design/functional matching, equipment maintenance, and reporting of data.

The primary focus of this standard is on circuit delayering and imaging techniques using scanning electron microscope or optical microscope. However, it also acknowledges the applicability of other microscope and probing techniques for recovering design data. It's important to note that the purpose of this standard is not to manufacture copies of a device but to compare images or recover the design for determining the authenticity of electronic parts.

Furthermore, if the AS6171/11 standard is invoked in a contract, the general requirements outlined in the AS6171 document also apply. This indicates the overarching importance of adhering to quality control and mitigation measures when dealing with suspect or counterfeit electronic parts.